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Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in today's technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and Internet use, assessment stakeholders--from graduate students to scholars to industry professionals--have numerous opportunities to study and create different types of tests and test items. This comprehensive analysis offers thorough coverage of the theoretical foundations and concepts that define AIG, as well as the practical considerations required to produce and apply large numbers of useful test items.
| ISBN | 9780367902933 |
| Autor(a) | Gierl, Mark J. |
| Editora | Routledge |
| Ano de edição | 2021 |
| Acabamento | Capa Dura |
| Dimensões | 22,90 X 15,20 |
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